- #1
quietrain
- 655
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i understand that when we shoot x-rays at a object, it will scatter in accordance to bragg's reflection law.
as such we position the detector as per the picture below
my question is , for the production of characteristic x-rays, does bragg's reflection law still holds? and why does it hold?
because say, if i shoot from a 45 degrees angle, why do i have to put my detector at 90degrees in accordance to bragg's law.
since characteristic x-rays are due to the electron falling into a lower state, it is not the same incident x-ray, so why does it follows bragg's law, where i have to have my detector at twice the incident angle on the target?
thanks
as such we position the detector as per the picture below
my question is , for the production of characteristic x-rays, does bragg's reflection law still holds? and why does it hold?
because say, if i shoot from a 45 degrees angle, why do i have to put my detector at 90degrees in accordance to bragg's law.
since characteristic x-rays are due to the electron falling into a lower state, it is not the same incident x-ray, so why does it follows bragg's law, where i have to have my detector at twice the incident angle on the target?
thanks