Can anyone explain the zero bias dark current observations in this paper?

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In summary, the paper discusses the phenomenon of zero bias dark current in semiconductor devices, exploring the conditions and mechanisms that lead to this observation. The findings highlight the role of defects and impurities in influencing dark current behavior, providing insights into optimizing device performance and understanding underlying physical processes. The paper invites further discussion on the implications of these observations for future research and applications in electronics.
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Devin-M
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I’ve been trying to understand the conclusions in this paper for a long time…

https://apps.dtic.mil/sti/tr/pdf/ADA429637.pdf

It seems it was published in Optical Engineering, Vol 38, No. 8, August 1999.

I thought if we have a photodetector with no light shining on it and no outside voltage applied to the terminals from an external source, ie “no bias voltage” then we shouldn’t measure any current from the device.

Specifically I am asking about the statement on page 1428, first sentence of last paragraph…

“In this study, we have attempted to explain the presence of a large nonzero dark current when the applied bias voltage is zero”

Where is the power coming from to produce this current if there is no external voltage applied and no light shining on the device?
 
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Devin-M said:
“In this study, we have attempted to explain the presence of a large nonzero dark current when the applied bias voltage is zero”

Where is the power coming from to produce this current if there is no external voltage applied and no light shining on the device?
First, they are talking miniscule amounts of current. Then, the effect occurs at very low temperature <50K. They attempt to explain it by a dynamic tunnelling process. They seem to suggest "trap-assisted and Fowler-Nordheim tunneling, which dominate at lower temperatures" as where the source of this tiny amount of energy comes. I would ask, is the entire circuit below 50K or just a part of it?
 
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"In any case, a dark current can normally not occur for operation with zero bias voltage, since there is no energy supply available for it – at least as long as the temperature of the device is uniform, excluding any Peltier effects."

from https://www.rp-photonics.com/dark_current.html
 
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IMO (for what it's worth) the author's explanation of zero bias tunneling anomalies is incomplete. I think a better explanation can be derived from the paper Surface magnetism of gallium arsenide nanofilms. From the abstract:
"Gallium arsenide (GaAs) is the most widely used second-generation semiconductor with a direct band gap, and it is being increasingly used as nanofilms. However, the magnetic properties of GaAs nanofilms have never been studied. Here we find by comprehensive density-functional-theory calculations that GaAs nanofilms cleaved along the ⟨111⟩ and ⟨100⟩ directions become intrinsically metallic films with strong surface magnetism and the magnetoelectric effect. Surface magnetism and electrical conductivity are realized via a combined effect of charge transfer induced by spontaneous electric polarization through the film thickness and spin-polarized surface states."
I infer from this paper that a normally applied infrared electric field can produce a tunneling current in an unbiased tunnel junction.
 
  • #5
Fred Wright said:
I infer from this paper that a normally applied infrared electric field can produce a tunneling current in an unbiased tunnel junction.
And was there such an applied field in the original paper the OP mentioned?
 
  • #6
bob012345 said:
They seem to suggest "trap-assisted and Fowler-Nordheim tunneling, which dominate at lower temperatures" as where the source of this tiny amount of energy comes.
I looked up Fowler-Nordheim tunneling and found the effect is used by applying voltage to erase flash memory but in this case no external voltage is being applied.
 

FAQ: Can anyone explain the zero bias dark current observations in this paper?

What is zero bias dark current?

Zero bias dark current refers to the electrical current that flows through a semiconductor device, such as a photodetector or a diode, when no external voltage is applied (i.e., at zero bias). This current is primarily due to thermally generated carriers and can affect the performance of the device, particularly in low-light conditions.

Why is it important to study zero bias dark current?

Studying zero bias dark current is crucial because it influences the noise characteristics and sensitivity of photodetectors. Understanding this current helps in optimizing device performance, improving signal-to-noise ratios, and enhancing the overall efficiency of imaging and detection systems.

What factors can influence zero bias dark current?

Several factors can influence zero bias dark current, including temperature, material properties, device geometry, and fabrication processes. Higher temperatures typically increase thermal generation of carriers, leading to higher dark current levels. Additionally, defects and impurities in the semiconductor material can also contribute to variations in dark current.

How can zero bias dark current be measured?

Zero bias dark current can be measured by connecting the device to a current meter while ensuring that no external voltage is applied. The measurement is typically conducted in a controlled environment, often at various temperatures, to analyze how the dark current responds to changes in conditions.

What implications do zero bias dark current observations have for device design?

Observations of zero bias dark current can inform device design by highlighting the need for improved materials and structures that minimize dark current. This can lead to the development of more sensitive and efficient photodetectors, which are essential for applications in fields such as telecommunications, medical imaging, and astronomy.

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