- #1
kitepassion
- 1
- 0
Hi to all,
I have the following problem: I want to characterize two lots of detectors in order to retrieve their mean cross section and standard deviation for a proton beam. For cross section I mean the number of counts respect the fluence of particle (fluence = integral of the particle flux over the time).
Now for each lot of sensor I have 12 detector. For each detector I made some measurements at different energy. For istance 3 measurements at 30 MeV, 10 measurements at 60 MeV and so on..
For each measurements more then 6000 counts were collected.
Now I want to calculate some meaningful parameter to characterize the detectors.
What I did was to collect all the measurements carried out at the same energy but on different detectors belonging to the same lot and calculating their mean and standard deviation as a gaussian distribution. Now the 1-sigma standard deviation could be called uncertainty?
Is the process correct? Am I missing something?
Should I use a Poisson distribution?
I have the following problem: I want to characterize two lots of detectors in order to retrieve their mean cross section and standard deviation for a proton beam. For cross section I mean the number of counts respect the fluence of particle (fluence = integral of the particle flux over the time).
Now for each lot of sensor I have 12 detector. For each detector I made some measurements at different energy. For istance 3 measurements at 30 MeV, 10 measurements at 60 MeV and so on..
For each measurements more then 6000 counts were collected.
Now I want to calculate some meaningful parameter to characterize the detectors.
What I did was to collect all the measurements carried out at the same energy but on different detectors belonging to the same lot and calculating their mean and standard deviation as a gaussian distribution. Now the 1-sigma standard deviation could be called uncertainty?
Is the process correct? Am I missing something?
Should I use a Poisson distribution?