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VincentYu
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Dear Group Members and Friends,
You are invited to join the OPTICA Thin Film Webinar next month.
Spectroscopic Ellipsometry: Principles, Considerations, & Applications
By Dr. Maxwell Junda from Covalent Metrology
11 July 2024 20:00 - 21:00
Eastern Daylight/Summer Time (US & Canada) (UTC -04:00)-------------------
Webinar description
Spectroscopic ellipsometry is a versatile, non-destructive optical measurement technique that combines superb precision with a high degree of surface sensitivity. However, in some cases, it is precisely its excellent sensitivity that can result in ellipsometry being one of the more challenging optical metrology methods to implement skillfully.
In this webinar, Dr. Max Junda will first provide an overview of how an ellipsometry measurement works and the data that is collected. Next, the factors that influence designing a successful experiment will be discussed from both a data collection and optical modeling perspective. Finally, a few interesting applications will be presented to demonstrate the various problems ellipsometry can be used to help solve.
About Dr. Max Junda
-------------------------------
Max Junda has been leading the spectroscopic ellipsometry services at Covalent Metrology since 2019. In this capacity, he has provided expert measurement, data modeling, and consulting services to over 110 separate customers across many industries. Max's particular interest is in developing data collection and optical modeling methods that are customized to each specific application to provide the most reliable results and expand the areas in which ellipsometry can used beyond standard use-cases. His previous experience in graduate school was wide-spectral-range ellipsometry from the THz to vacuum ultraviolet and application of ellipsometry to the fabrication and optimization of thin film solar cells.
Max earned a PhD from the University of Toledo and a BS from Middlebury College, both in Physics.
Please make your registration at
https://www.optica.org/events/webin...metry_principles_considerations_applications/
Thank you!
Yi-Jun Jen
Chair, OPTICA Thin Films Technical Group
Professor, National Taipei University of Technology
You are invited to join the OPTICA Thin Film Webinar next month.
Spectroscopic Ellipsometry: Principles, Considerations, & Applications
By Dr. Maxwell Junda from Covalent Metrology
11 July 2024 20:00 - 21:00
Eastern Daylight/Summer Time (US & Canada) (UTC -04:00)-------------------
Webinar description
Spectroscopic ellipsometry is a versatile, non-destructive optical measurement technique that combines superb precision with a high degree of surface sensitivity. However, in some cases, it is precisely its excellent sensitivity that can result in ellipsometry being one of the more challenging optical metrology methods to implement skillfully.
In this webinar, Dr. Max Junda will first provide an overview of how an ellipsometry measurement works and the data that is collected. Next, the factors that influence designing a successful experiment will be discussed from both a data collection and optical modeling perspective. Finally, a few interesting applications will be presented to demonstrate the various problems ellipsometry can be used to help solve.
About Dr. Max Junda
-------------------------------
Max Junda has been leading the spectroscopic ellipsometry services at Covalent Metrology since 2019. In this capacity, he has provided expert measurement, data modeling, and consulting services to over 110 separate customers across many industries. Max's particular interest is in developing data collection and optical modeling methods that are customized to each specific application to provide the most reliable results and expand the areas in which ellipsometry can used beyond standard use-cases. His previous experience in graduate school was wide-spectral-range ellipsometry from the THz to vacuum ultraviolet and application of ellipsometry to the fabrication and optimization of thin film solar cells.
Max earned a PhD from the University of Toledo and a BS from Middlebury College, both in Physics.
Please make your registration at
https://www.optica.org/events/webin...metry_principles_considerations_applications/
Thank you!
Yi-Jun Jen
Chair, OPTICA Thin Films Technical Group
Professor, National Taipei University of Technology