- #1
baffledMatt
- 153
- 0
Does anybody know any neat measurements one can do to characterise a surface? I'm thinking generally of rough surfaces such as the ones you come across in epitaxial systems.
In other words:
If I have two ensembles of surfaces, what is the best method to use to determine whether the same growth process was used for each ensemble?
The ideas I have so far are:
Power spectrum
Wavelet analysis
but these can be unreliable as it is quite easy to make two different processes create very similar looking power spectra, etc. This makes life especially difficult with experimental data because you generally don't have the statistics you would like.
Also, does anybody know anything about what resampling methods exist for this type of scenario? I have seen people who scan lines across the surface and take separate measurements for each one, then do exactly the same thing again but with the lines going at right angles to the first ones. Due to the huge amount of correlation, this method seems dodgy as hell to me.
Matt
In other words:
If I have two ensembles of surfaces, what is the best method to use to determine whether the same growth process was used for each ensemble?
The ideas I have so far are:
Power spectrum
Wavelet analysis
but these can be unreliable as it is quite easy to make two different processes create very similar looking power spectra, etc. This makes life especially difficult with experimental data because you generally don't have the statistics you would like.
Also, does anybody know anything about what resampling methods exist for this type of scenario? I have seen people who scan lines across the surface and take separate measurements for each one, then do exactly the same thing again but with the lines going at right angles to the first ones. Due to the huge amount of correlation, this method seems dodgy as hell to me.
Matt
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