How does atomic force microscope create tunnelling?

In summary, AFM systems use the van der Waals force to place atoms on the sample surface, which can be used to create a 1-electron transistor.
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  • #2
As I understand, the way Atomic Force Microscopes (AFM) work is by taking advantage of the van der Waals force between the tip and the surface. It is important to note that the tip does not actually touch the surface of the sample: leaving a very small space in between them.

In Scanning Tunnelling Microscope (STM), a bias is placed between the tip and the sample surface. For this example, let's place a positive bias on the tip, and negative bias on the surface. Since the gap between them is very small, there is a possibility where the electron from the surface of a conducting sample can tunnel through the thin layer of air to the tip of the microscope.

This case is similar to electron tunnelling through a thin potential barrier in quantum mechanics.
 
  • #3
The AFM has nothing to do with tunneling in this context. AFM is just used to place atoms on the surface in the arrangement that's needed. Probably a quantum corral, or something similar. The electron can tunnel into and out of the corral, which can control the current, making a 1-electron transistor that the article talks about.

The STM, which maxxlr8 mentions, is a completely different type of scanning microscope, which does, in fact, make use of tunneling current. But it has nothing to do with this article.
 
  • #4
The confusing comes in because in some system, the AFM system can be converted into a STM system with minor adjustments (sometime, just by the electronics).

STM system uses the principle of tunneling, where the vacuum is the potential barrier. AFM system does not make use of tunneling, as has been explained in this thread.

Zz.
 

FAQ: How does atomic force microscope create tunnelling?

1. What is an Atomic Force Microscope (AFM)?

An Atomic Force Microscope (AFM) is a scientific instrument used to study the surface of materials with atomic resolution. It uses a tiny probe, typically a few nanometers in diameter, to scan the surface of a sample and create a detailed image. The probe is attached to a cantilever arm that measures the forces between the probe and the sample, providing information about the surface characteristics of the material being studied.

2. How does an AFM work?

An AFM works by scanning a tiny probe over the surface of a sample. The probe is attached to a cantilever arm, which is used to measure the forces between the probe and the sample surface. As the probe moves over the surface, it creates a 3D image of the surface topography with atomic resolution. The forces measured by the cantilever arm can also provide information about the material's properties, such as its stiffness or adhesion.

3. What are the advantages of using an AFM?

AFMs offer several advantages over other types of microscopes. They can provide atomic resolution images, making them useful for studying materials at the nanoscale. They can also be used to study a wide range of materials, including biological samples, polymers, and semiconductors. Additionally, AFMs can operate in various environments, including air, liquid, and vacuum, making them versatile instruments for scientific research.

4. What are some applications of AFMs?

AFMs have a wide range of applications in various fields of science and technology. In material science, AFMs are used to study the surface properties of materials, such as roughness, adhesion, and elasticity. In biology, AFMs can image biological samples with high resolution, providing insights into the structure and function of cells and biomolecules. AFMs are also used in nanotechnology, semiconductor research, and many other areas of scientific research and development.

5. What are the limitations of AFMs?

AFMs have some limitations that researchers should consider when using them. The scanning process can be slow, and image acquisition can take several minutes or longer, depending on the size of the sample. Additionally, the probe can damage delicate samples, so researchers must use caution when scanning sensitive materials. Finally, AFMs are expensive instruments that require specialized training to operate properly, making them less accessible to some researchers.

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