Index of refraction and thickness of materials

[ralden]

Hi, my current research is to determine the thickness and the index of refraction of semiconductor materials.. using reflectivity.. my adviser gave me the results of the sample by GRAPHS the reflectance percentage vs. the wavelength.. i know that i can measure the index of refraction.. if i know the the thickness.. but in my case i will measure the thickness and the index of refraction simultaneously, i run this at two different angles 90 and 45, so anyone who knows to determine the thickness and index of refraction Using the graph of reflectivity? ty

 

[_coyote_]

The general procedure for determining the thickness and index of refraction of semiconductor materials using reflectivity is to measure the reflectance as a function of wavelength, then fit a model of the optical properties of the material to the data. The parameters of the model that are most relevant to the thickness and refractive index of the material are the refractive index and the extinction coefficient. Using the model, you can then calculate the thickness and refractive index of the material based on the measured reflectance values. There are various methods for fitting the model to the data, such as using nonlinear least-squares optimization or Monte Carlo simulations. Once you have the parameters of the model, you can then use them to calculate the thickness and refractive index of the material. You may also need to consider the angle of incidence when measuring the reflectance, as it affects the amount of light that is reflected from the material. If you measure the reflectance at two different angles (e.g. 90° and 45°), then you will need to take this into account when fitting the model to the data.