- #1
lcr2139
- 62
- 1
Hello, I know that spectroscopic ellipsometry (SE) is more accurate than single-wavelength ellipsometry (SWE), but I would like to know how to create a dispersion model using SWE instead of SE.
SE sweeps over wavelength, measures reflectivity vs. wavelength, and gives a variety of optical constants, but SWE only gives out thickness and refractive index. SWE's are made with lasers and can only measure at one wavelength. I know that having a spectrum of wavelengths can give more accurate measures than SWE, but can we make a dispersion model out of measuring only the thickness and refractive index?
SE sweeps over wavelength, measures reflectivity vs. wavelength, and gives a variety of optical constants, but SWE only gives out thickness and refractive index. SWE's are made with lasers and can only measure at one wavelength. I know that having a spectrum of wavelengths can give more accurate measures than SWE, but can we make a dispersion model out of measuring only the thickness and refractive index?