- #1
einstein1921
- 76
- 0
I am curious about a question. in synchrotron station,people use x ray to do kinds of experiments.
They use the x ray ,how do they know the characteristic(like wavelength,brightness) of the ray they use. Does they measure the x ray when they use it simultaneously? Does this have an bad effect on
the stability of the x ray? if they characterization before application,is this too troublesome? how they actually change between characterization and application? Thank you!
They use the x ray ,how do they know the characteristic(like wavelength,brightness) of the ray they use. Does they measure the x ray when they use it simultaneously? Does this have an bad effect on
the stability of the x ray? if they characterization before application,is this too troublesome? how they actually change between characterization and application? Thank you!
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