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How can we distinguish between Auger and core-level loss peaks (such as in XPS) in the secondary electron spectrum?
The main difference between Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS) is the type of information they provide. AES measures the kinetic energy of secondary electrons emitted from a sample, while XPS measures the binding energy of core electrons.
AES is commonly used to analyze surfaces of inorganic materials, while XPS is used for a wider range of materials including organic compounds and biomaterials.
In AES, the kinetic energy distribution is used to identify the elements present in a sample and their relative concentrations. In XPS, the binding energy spectrum is used to determine the chemical bonding and electronic states of elements in a sample.
AES has a higher sensitivity and can detect elements with lower atomic numbers. It also has a higher spatial resolution, making it better for studying surface layers. Additionally, AES does not require the use of a vacuum, allowing for in situ analysis of samples.
XPS is better suited for analyzing thicker layers and more complex compounds, as it can provide more detailed information about the chemical composition and electronic structure of a sample. It is also more widely available and user-friendly, making it a more popular choice for routine analysis.