- #1
PainterGuy
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- TL;DR Summary
- Some questions about dynamic RAM memory cells such as refresh cycle, cost per bit, etc.
Hi,
Could you please help me with the questions below? All of the questions are related to each other. Thank you.
Question 1:
Please have a look on this attachment. The following text is from the parts highlighted in yellow in attachment.
"Dynamic memory cells store a data bit in a small capacitor rather than in a latch. The advantage of this type of cell is that it is very simple, thus allowing very large memory arrays to be constructed on a chip at a lower cost per bit. The disadvantage is that the storage capacitor cannot hold its charge over an extended period of time and will lose the stored data bit unless its charge is refreshed periodically. To refresh requires additional memory circuitry and complicates the operation of the DRAM."
"Again, because charge stored in a capacitor will leak off, the DRAM cell requires a frequent refresh operation to preserve the stored data bit. This requirement results in more complex circuitry than in a SRAM."
Some of the text from the same passage seems self-contradictory but I'd say that the author is trying to say that advantages of using DRAM over-weighs its disadvantages, and at the end of day its per bit price is still less than that of SRAM. Do I have it correct?
Question 2:
In my opinion FIGURE 11-18 under Address Multiplexing section is misleading. Let me elaborate. The text in the para right under FIGURE 11-18 says, "First, the 10-bit row address is latched into the row address register. Next, the 10-bit column address is latched into the column address register. The row address and the column address are decoded to select one of the 1,048,576 addresses (220 = 1,048,576) in the memory array". The shown Row line, which activates the gate, is fine but the bit line or Column line is quite misleading or incorrect, in my humble opinion. I have tried to fix it in this attachment. The 'yellow' and 'green' buffers could be active-HIGH or active-LOW depending upon the output of address decoders; as shown the buffers are active-HIGH. Each Row line has an input which is turned on by the address decoder and each column line also has an input buffer which is controlled by column address decoder, and together they are used to select a single cell in the memory array. Do I make sense?
Question 3:
In the very last two paragraphs in green the following is said.
"The two types of refresh operations are RAS' only refresh and CAS' before RAS' refresh. RAS'-only refresh consists of a RAS' transition to the LOW (active) state, which latches the address of the row to be refreshed while CAS' remains HIGH (inactive) throughout the cycle. An external counter is used to provide the row addresses for this type of operation.
The CAS' before RAS' refresh is initiated by CAS' going LOW before RAS' goes LOW. This sequence activates an internal refresh counter that generates the row address to be refreshed. This address is switched by the data selector into the row decoder."
(The apostrophe means bar over the word.)
You might find FIGURE 11-19 helpful. I don't understand refresh operation could be carried for "RAS'-only refresh" when CAS' remains HIGH (inactive) throughout the cycle. An external counter let's you to switch from one row to another and I understand that each row line connects to the gates of all transistors in that row. How could you refresh the charge when none of the columns have been selected?
I'm also confused about "CAS' before RAS' refresh". I understand that first CAS, i.e. Column Address Select, goes LOW and then RAS, i.e. Row Address Select, goes LOW. To switch rows, an internal refresh counter is used but what about the columns? How do you switch from one column to another? Don't you need a counter too?
Question 4:
This question is directly related to Question 3.
The following text could be found in this PDF under the section BURST REFRESH on page #1 : https://downloads.reactivemicro.com/Electronics/DRAM/DRAM Refresh.pdf . (BTW, you could access the same PDF here from my Google drive where I have highlighted the text.)
"BURST REFRESH
Refresh may be achieved in a burst method by performing a series of refresh cycles, one right after the other until all rows have been accessed. During refresh other commands are not allowed. Below is a drawing representing burst and distributed refresh.
For example: a 4 Meg x 1 requires 1,024 consecutive refresh cycles, each of which will use 130ns (tRC) for a 70ns device:
1,024 cycles * 130ns = 133,120ns = 0.133ms
16ms - 0.133ms = 15.867ms
Approximately 0.13ms would be spent performing refresh, and the remaining 15.87ms could be spent reading and writing; then burst refresh would occur again, and so on."
Where does this "for a 70 ns device" come from? What does this "70 ns" time represent?
Thanks a lot for your time and help!
Could you please help me with the questions below? All of the questions are related to each other. Thank you.
Question 1:
Please have a look on this attachment. The following text is from the parts highlighted in yellow in attachment.
"Dynamic memory cells store a data bit in a small capacitor rather than in a latch. The advantage of this type of cell is that it is very simple, thus allowing very large memory arrays to be constructed on a chip at a lower cost per bit. The disadvantage is that the storage capacitor cannot hold its charge over an extended period of time and will lose the stored data bit unless its charge is refreshed periodically. To refresh requires additional memory circuitry and complicates the operation of the DRAM."
"Again, because charge stored in a capacitor will leak off, the DRAM cell requires a frequent refresh operation to preserve the stored data bit. This requirement results in more complex circuitry than in a SRAM."
Some of the text from the same passage seems self-contradictory but I'd say that the author is trying to say that advantages of using DRAM over-weighs its disadvantages, and at the end of day its per bit price is still less than that of SRAM. Do I have it correct?
Question 2:
In my opinion FIGURE 11-18 under Address Multiplexing section is misleading. Let me elaborate. The text in the para right under FIGURE 11-18 says, "First, the 10-bit row address is latched into the row address register. Next, the 10-bit column address is latched into the column address register. The row address and the column address are decoded to select one of the 1,048,576 addresses (220 = 1,048,576) in the memory array". The shown Row line, which activates the gate, is fine but the bit line or Column line is quite misleading or incorrect, in my humble opinion. I have tried to fix it in this attachment. The 'yellow' and 'green' buffers could be active-HIGH or active-LOW depending upon the output of address decoders; as shown the buffers are active-HIGH. Each Row line has an input which is turned on by the address decoder and each column line also has an input buffer which is controlled by column address decoder, and together they are used to select a single cell in the memory array. Do I make sense?
Question 3:
In the very last two paragraphs in green the following is said.
"The two types of refresh operations are RAS' only refresh and CAS' before RAS' refresh. RAS'-only refresh consists of a RAS' transition to the LOW (active) state, which latches the address of the row to be refreshed while CAS' remains HIGH (inactive) throughout the cycle. An external counter is used to provide the row addresses for this type of operation.
The CAS' before RAS' refresh is initiated by CAS' going LOW before RAS' goes LOW. This sequence activates an internal refresh counter that generates the row address to be refreshed. This address is switched by the data selector into the row decoder."
(The apostrophe means bar over the word.)
You might find FIGURE 11-19 helpful. I don't understand refresh operation could be carried for "RAS'-only refresh" when CAS' remains HIGH (inactive) throughout the cycle. An external counter let's you to switch from one row to another and I understand that each row line connects to the gates of all transistors in that row. How could you refresh the charge when none of the columns have been selected?
I'm also confused about "CAS' before RAS' refresh". I understand that first CAS, i.e. Column Address Select, goes LOW and then RAS, i.e. Row Address Select, goes LOW. To switch rows, an internal refresh counter is used but what about the columns? How do you switch from one column to another? Don't you need a counter too?
Question 4:
This question is directly related to Question 3.
The following text could be found in this PDF under the section BURST REFRESH on page #1 : https://downloads.reactivemicro.com/Electronics/DRAM/DRAM Refresh.pdf . (BTW, you could access the same PDF here from my Google drive where I have highlighted the text.)
"BURST REFRESH
Refresh may be achieved in a burst method by performing a series of refresh cycles, one right after the other until all rows have been accessed. During refresh other commands are not allowed. Below is a drawing representing burst and distributed refresh.
For example: a 4 Meg x 1 requires 1,024 consecutive refresh cycles, each of which will use 130ns (tRC) for a 70ns device:
1,024 cycles * 130ns = 133,120ns = 0.133ms
16ms - 0.133ms = 15.867ms
Approximately 0.13ms would be spent performing refresh, and the remaining 15.87ms could be spent reading and writing; then burst refresh would occur again, and so on."
Where does this "for a 70 ns device" come from? What does this "70 ns" time represent?
Thanks a lot for your time and help!