- #1
RichardOsmond
- 7
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Hi all,
using the mass attenuation coefficient and density, one can determine the percentage of X-rays absorbed in a material for a given depth, using the Beer-Lambert Law. e.g. The intensity of a beam of 8 keV X-rays will be reduced by 68% after passing through 70 microns of Silicon. From my understanding, this formula is used to determine the absorption of a beam of X-ray photons. e.g. in the example i just gave, if 1,000 8 keV photons are incident on the surface of the silicon, only 320 will be present after 70 microns. My question is, how do i determine the probability of where a single photon will be absorbed? If there is only a single 8 keV photon incident on the silicon, at which depth will it be absorbed?
Thanks.
using the mass attenuation coefficient and density, one can determine the percentage of X-rays absorbed in a material for a given depth, using the Beer-Lambert Law. e.g. The intensity of a beam of 8 keV X-rays will be reduced by 68% after passing through 70 microns of Silicon. From my understanding, this formula is used to determine the absorption of a beam of X-ray photons. e.g. in the example i just gave, if 1,000 8 keV photons are incident on the surface of the silicon, only 320 will be present after 70 microns. My question is, how do i determine the probability of where a single photon will be absorbed? If there is only a single 8 keV photon incident on the silicon, at which depth will it be absorbed?
Thanks.