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I'm currently an undergrad research assistant in a lab that is experimenting with the interface between ferroelectrics and ferromagnetics. We have many thin film samples with various thicknesses and we often need to find out the thickness of these samples,which are mostly LSMO and PZT, as the sputtering of said samples can be off sometimes.
My question is this:
How can I read our XRR data to find the thickness of our samples? I've not been able to find any resources that explain the reflection peaks in terms of characteristics of the sample, such as layer thickness, density...etc.
Also, we have a sample that is wedge shaped, where the LSMO has a thickness of ~100nm on one side, and tappers off to 0. This wedge is then on top of a constant layer of PZT. Is there any standard and well-proven method to find the changing thickness of this sample.
Lastly, any tips and tricks with GenX would be appreciated also.
THANKS
My question is this:
How can I read our XRR data to find the thickness of our samples? I've not been able to find any resources that explain the reflection peaks in terms of characteristics of the sample, such as layer thickness, density...etc.
Also, we have a sample that is wedge shaped, where the LSMO has a thickness of ~100nm on one side, and tappers off to 0. This wedge is then on top of a constant layer of PZT. Is there any standard and well-proven method to find the changing thickness of this sample.
Lastly, any tips and tricks with GenX would be appreciated also.
THANKS