- #1
ema
- 1
- 0
Hello,
I am a newbie in AFM and do not have enough time to figure out the answer to a probably easy question:
I need to image continuously, for several times without modifying the scan settings, a relatively flat sample (+/-3 or 4nm) and I notice the following:
In CM, after a while, the deflection is drifted to (usually) higher values, fact that is modifying considerably the sample-probe interaction force. This is also visible in the images (higher or lower heights) and is destroying the sample.
Similar effects I see in TM: after taking several images the set point doesn’t remain the same any more..the pictures are getting fade and I recover them only after modifying the scan settings.
I would like to know what is the cause of these effects and if there is a way to eliminate them.
Many thanks,
ema
I am a newbie in AFM and do not have enough time to figure out the answer to a probably easy question:
I need to image continuously, for several times without modifying the scan settings, a relatively flat sample (+/-3 or 4nm) and I notice the following:
In CM, after a while, the deflection is drifted to (usually) higher values, fact that is modifying considerably the sample-probe interaction force. This is also visible in the images (higher or lower heights) and is destroying the sample.
Similar effects I see in TM: after taking several images the set point doesn’t remain the same any more..the pictures are getting fade and I recover them only after modifying the scan settings.
I would like to know what is the cause of these effects and if there is a way to eliminate them.
Many thanks,
ema