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sparkle123
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This is an excerpt from my textbook. Could someone please help me understand why the line I highlighted in yellow is true? Thanks! :)
kuruman said:Suppose E is non-zero and in fact looks as shown in the drawing. Then if you chop the path along the line from A to B in many, say 1000, small pieces ds, you can calculate 1000 dot products E.ds each of which is equal to Eds and positive because the cosine of the angle between E and ds is +1. Now if you add 1000 positive numbers, what do you end up with?
The statement is "... we can always find a path ..." I have found such a path. It is the one in which E is always parallel to ds.mathfeel said:I don't think one can assume that this path drawn on the textbook necessarily follows some unknown field line. Along the curve, the E field might not might not be parallel to dS.
If there is a charge, yes you are right. However, the textbook clearly states "Let assume that no charges are inside the cavity." You cannot change the assumptions then claim that the argument is no good.mathfeel said:Anyway, I think this particular argument of the textbook is not very good. What if there is a some charge in the cavity? In this case, electric field is clearly not zero. Yet the potential difference between A and B is still zero.
A cavity within a conductor refers to an empty space or void located within a material that can conduct electricity, such as a metal.
A cavity within a conductor can be caused by a variety of factors, including defects in the material, physical damage, or the presence of impurities.
A cavity within a conductor can significantly reduce the conductivity of the material, as it disrupts the flow of electrons and creates areas of higher resistance.
In most cases, a cavity within a conductor cannot be repaired. However, it can be prevented by using high-quality materials and proper handling and storage techniques.
A cavity within a conductor can lead to equipment malfunction, increased energy consumption, and potential safety hazards. It can also affect the performance and lifespan of electronic devices.