- #1
bramdam
- 20
- 0
We manufacture crank case heaters and they are designed with an 800V 1A STD Recovery diode. We do not Hi-pot the heater with the diode in it we only test to make sure we have an ohm reading in one direction and an OL in the other.
However, our customer installs our heater into a system and Hi-pot the entire system. They do a 1 second test at 1.8 kV and then a ramped test maxing out at 3.25kV for one minute. I claim they are damaging if not destroying the diode by doing that test with it in the circuit which is leading to hi-amp readings at their final QC station if not total failures.
Not being an expert, I am just looking for some verification that their test could be or is damaging the diode thus causing failures. Now how and if I can design around their test is another issue.
Thanks
However, our customer installs our heater into a system and Hi-pot the entire system. They do a 1 second test at 1.8 kV and then a ramped test maxing out at 3.25kV for one minute. I claim they are damaging if not destroying the diode by doing that test with it in the circuit which is leading to hi-amp readings at their final QC station if not total failures.
Not being an expert, I am just looking for some verification that their test could be or is damaging the diode thus causing failures. Now how and if I can design around their test is another issue.
Thanks