SPM and STM achieve nanoscale probing without contact through advanced feedback electronics, specifically phase-locked loops (PLLs), which ensure precise control. The use of piezoelectric stacks enables fine position adjustments, allowing the probe to hover at the optimal distance from the sample. This combination of technologies facilitates accurate measurements while preventing physical contact. The overall mechanism is surprisingly straightforward yet highly effective. Understanding these principles is crucial for advancements in nanoscale imaging and manipulation.